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Publication search results
found 232 matches
- 2024
- Haripriya R. S, Soumitro Vyapari, Jaynarayan T. Tudu:
Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing. VLSID 2024: 712-717 - Vedant Sawal, Hiu Yung Wong:
Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning. CoRR abs/2402.10981 (2024) - 2023
- Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas:
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. 39(2): 227-243 (2023) - Priyanka Joshi, Bodhisatwa Mazumdar:
SPSA: Semi-Permanent Stuck-At fault analysis of AES Rijndael SBox. J. Cryptogr. Eng. 13(2): 201-222 (2023) - Hyein Shin, Myeonggu Kang, Lee-Sup Kim:
Fault-Free: A Framework for Analysis and Mitigation of Stuck-at-Fault on Realistic ReRAM-Based DNN Accelerators. IEEE Trans. Computers 72(7): 2011-2024 (2023) - Chenghao Quan, Mohammed E. Fouda, Sugil Lee, Giju Jung, Jongeun Lee, Ahmed M. Eltawil, Fadi J. Kurdahi:
Training-Free Stuck-At Fault Mitigation for ReRAM-Based Deep Learning Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2174-2186 (2023) - Udit Kumar Agarwal, Abraham Chan, Ali Asgari Khoshouyeh, Karthik Pattabiraman:
Towards Reliability Assessment of Systolic Arrays against Stuck-at Faults. DSN-S 2023: 230-236 - Md. Oli-Uz-Zaman, Saleh Ahmad Khan, William Oswald, Zhiheng Liao, Jinhui Wang:
Reconfigurable Mapping Algorithm based Stuck-At-Fault Mitigation in Neuromorphic Computing Systems. ACM Great Lakes Symposium on VLSI 2023: 261-266 - Hyeonsu Bang, Kang Eun Jeon, Johnny Rhe, Jong Hwan Ko:
DCR: Decomposition-Aware Column Re-Mapping for Stuck-At-Fault Tolerance in ReRAM Arrays. ICCD 2023: 491-494 - Shaofeng Zhao, Bo Liu, Fang Wang, Dan Feng, Xiang Chen:
TOSA: Tolerating Stuck-At-Faults in Edge-based RRAM Inference Accelerators. ICPADS 2023: 1181-1190 - 2022
- Md. Oli-Uz-Zaman, Saleh Ahmad Khan, William Oswald, Zhiheng Liao, Jinhui Wang:
Stuck-at-Fault Immunity Enhancement of Memristor-Based Edge AI Systems. IEEE J. Emerg. Sel. Topics Circuits Syst. 12(4): 922-933 (2022) - Navya Mohan, J. P. Anita:
Test and diagnosis pattern generation for distinguishing stuck-at faults and bridging faults. Integr. 83: 24-32 (2022) - Sutapa Sarkar, Biplab Kumar Sikdar, Mousumi Saha:
Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory. Frontiers Inf. Technol. Electron. Eng. 23(7): 1110-1126 (2022) - Tomohiro Ishii, Kazuteru Namba:
Stuck-at Fault Tolerance in DNN Using Statistical data. PRDC 2022: 256-257 - 2021
- Mousum Handique:
Construction of complete minimal test set for single intra-level bridging and stuck-at faults in reversible circuits. Int. J. Adv. Intell. Paradigms 18(3): 373-397 (2021) - Mousum Handique, Jantindra Kumar Deka, Santosh Biswas:
Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit. ATS 2021: 55-60 - Giju Jung, Mohammed E. Fouda, Sugil Lee, Jongeun Lee, Ahmed M. Eltawil, Fadi J. Kurdahi:
Cost- and Dataset-free Stuck-at Fault Mitigation for ReRAM-based Deep Learning Accelerators. DATE 2021: 1733-1738 - Yu Ma, Linfeng Zheng, Pingqiang Zhou:
Tolerating Stuck-at Fault and Variation in Resistive Edge Inference Engine via Weight Mapping. ACM Great Lakes Symposium on VLSI 2021: 313-318 - Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin, Thomas Lange, Maximilien Glorieux:
Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. ISQED 2021: 24-30 - An Qi Zhang, Amr M. S. Tosson, Lan Wei:
Error Resilience and Recovery of Process Induced Stuck-at Faults in MLP Neural Networks using Emerging Technology. NANOARCH 2021: 1-6 - Jianmin Wang, Fengqiu Liu, Yuhu Wu:
Stuck-at Fault Diagnosis of Four-bit Carry Look-ahead Adder by Shannon Expansion via Semi-tensor Product. SICE 2021: 933-938 - Priyanka Joshi, Bodhisatwa Mazumdar:
A Semi-Permanent Stuck-At Fault Analysis on AES Rijndael SBox. IACR Cryptol. ePrint Arch. 2021: 1124 (2021) - 2020
- Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Elena I. Vatajelu:
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices. J. Electron. Test. 36(3): 313-326 (2020) - Irith Pomeranz:
Broadside Tests for Transition and Stuck-At Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(8): 1739-1743 (2020) - Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2990-2999 (2020) - Baogang Zhang, Necati Uysal, Deliang Fan, Rickard Ewetz:
Handling Stuck-at-Fault Defects Using Matrix Transformation for Robust Inference of DNNs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2448-2460 (2020) - Chao Zhang, Khaled Abdelaal, Angel Chen, Xinhui Zhao, Wujie Wen, Xiaochen Guo:
ECC Cache: A Lightweight Error Detection for Phase-Change Memory Stuck-At Faults. ICCAD 2020: 59:1-59:9 - 2019
- Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das:
Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits. J. Circuits Syst. Comput. 28(12): 1950212:1-1950212:18 (2019) - Irith Pomeranz:
Skewed-Load Tests for Transition and Stuck-at Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1969-1973 (2019) - Isma Farah Siddiqui, Nawab Muhammad Faseeh Qureshi, Muhammad Akram Shaikh, Bhawani Shankar Chowdhry, Asad Abbas, Ali Kashif Bashir, Scott Uk-Jin Lee:
Stuck-at Fault Analytics of IoT Devices Using Knowledge-based Data Processing Strategy in Smart Grid. Wirel. Pers. Commun. 106(4): 1969-1983 (2019)
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