Остановите войну!
for scientists:
default search action
Search dblp
Full-text search
- > Home
Please enter a search query
- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal" - exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics" - boolean and: separate words by space
e.g., codd model - boolean or: connect words by pipe symbol (|)
e.g., graph|network
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
Author search results
no matches
Venue search results
no matches
Refine list
refine by author
- no options
- temporarily not available
refine by venue
- no options
- temporarily not available
refine by type
- no options
- temporarily not available
refine by access
- no options
- temporarily not available
refine by year
- no options
- temporarily not available
Publication search results
found 231 matches
- 2023
- Seokmin Park, Gayeong Lee, Jaehwan Shin, Seunghan Lee, Young-Woo Lee:
Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction. ICAIIC 2023: 539-542 - 2022
- Ankush Srivastava, Jais Abraham:
Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. ITC 2022: 446-455 - 2021
- Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1875-1888 (2021) - 2020
- Eduard Relea, Varun Urundolil Kumaran, Alberto Sanchez Cebrian, Christian Gschnitzer-Bärnthaler, Markus Zogg, Lukás Weiss, Konrad Wegener:
Utilization of CFRP in High-Speed Stamping Presses and its Gigacycle Fatigue Testing at Resonance Frequency. Int. J. Autom. Technol. 14(2): 311-325 (2020) - Artur Andrearczyk, Magdalena Mieloszyk, Pawel Baginski:
Destructive Tests of an Additively Manufactured Compressor Wheel Performed at High Rotational Speeds. AHFE (16) 2020: 117-123 - Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *. ATS 2020: 1-6 - Salem Abdennadher, Kyle Tripician, Senthil Singaravelu:
At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes. LATS 2020: 1-5 - 2019
- Alexander Sprenger, Sybille Hellebrand:
Divide and Compact - Stochastic Space Compaction for Faster-than-at-Speed Test. J. Circuits Syst. Comput. 28(Supplement-1): 1940001:1-1940001:23 (2019) - Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn:
An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. ITC 2019: 1-10 - 2018
- Alexander Sprenger, Sybille Hellebrand:
Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. DDECS 2018: 73-78 - Mahn-Suk Yoon, Sung-Hun Lee, Chang-Kyo Lee, Soo-Hyun Cho, Wan-Jin Ko:
Performance Test of LTE-R Railway Wireless Communication at High-Speed (350 km/h) Environments. ICUFN 2018: 637-640 - Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang:
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC 2018: 7-8 - Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault:
Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits. VTS 2018: 1-6 - 2017
- Kyomin Sohn, Won-Joo Yun, Reum Oh, Chi-Sung Oh, Seong-Young Seo, Min-Sang Park, Dong-Hak Shin, Won-Chang Jung, Sang-Hoon Shin, Je-Min Ryu, Hye-Seung Yu, Jae-Hun Jung, Hyunui Lee, Seok-Yong Kang, Young-Soo Sohn, Jung-Hwan Choi, Yong-Cheol Bae, Seong-Jin Jang, Gyo-Young Jin:
A 1.2 V 20 nm 307 GB/s HBM DRAM With At-Speed Wafer-Level IO Test Scheme and Adaptive Refresh Considering Temperature Distribution. IEEE J. Solid State Circuits 52(1): 250-260 (2017) - Satya Trinadh Adireddy, Seetal Potluri, Ch. Sobhan Babu, Veezhinathan Kamakoti, Shiv Govind Singh:
Optimal Don't Care Filling for Minimizing Peak Toggles During At-Speed Stuck-At Testing. ACM Trans. Design Autom. Electr. Syst. 23(1): 5:1-5:26 (2017) - Houssam Abbas, Matthew O'Kelly, Alëna Rodionova, Rahul Mangharam:
Safe At Any Speed: A Simulation-Based Test Harness for Autonomous Vehicles. CyPhy 2017: 94-106 - Matthias Kampmann, Sybille Hellebrand:
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. DDECS 2017: 35-41 - Bonita Bhaskaran, Sailendra Chadalavada, Shantanu Sarangi, Nithin Valentine, Venkat Abilash Reddy Nerallapally, Ayub Abdollahian:
At-speed capture global noise reduction & low-power memory test architecture. VTS 2017: 1-6 - 2016
- Kapil Juneja, Darayus Adil Patel, Rajesh Kumar Immadi, Balwant Singh, Sylvie Naudet, Pankaj Agarwal, Arnaud Virazel, Patrick Girard:
An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization. J. Electron. Test. 32(6): 721-733 (2016) - Zhou Jiang, Guiming Luo, Kele Shen:
Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing. IEICE Trans. Electron. 99-C(9): 1071-1079 (2016) - Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara:
Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(12): 2310-2319 (2016) - Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen:
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. ATS 2016: 173-178 - Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte:
Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test. ATS 2016: 19-24 - Po-Fan Hou, Yi-Tsung Lin, Jiun-Lang Huang, Ann Shih, Zoe F. Conroy:
An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. ATS 2016: 167-172 - Matthias Kampmann, Sybille Hellebrand:
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. ATS 2016: 1-6 - Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen:
SAT-based post-processing for regional capture power reduction in at-speed scan test generation. ETS 2016: 1-6 - Hyunmin Jang, Jongmin Lee, Hyeonmin Choi, Sungmin Cho:
Study on the field test result of mobile MMT trial service over LTE network at open dense area, subway and high speed train. ICME 2016: 1-3 - Hyunmin Jang, Jongmin Lee, Hyeonmin Choi, Sungmin Cho:
Study on the field test result of mobile MMT trial service over LTE network at open dense area, subway and high speed train. ICME Workshops 2016: 1-3 - Kyomin Sohn, Won-Joo Yun, Reum Oh, Chi-Sung Oh, Seong-Young Seo, Min-Sang Park, Dong-Hak Shin, Won-Chang Jung, Sang-Hoon Shin, Je-Min Ryu, Hye-Seung Yu, Jae-Hun Jung, Kyung-Woo Nam, Seouk-Kyu Choi, Jaewook Lee, Uksong Kang, Young-Soo Sohn, Jung-Hwan Choi, Chi-Wook Kim, Seong-Jin Jang, Gyo-Young Jin:
18.2 A 1.2V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution. ISSCC 2016: 316-317 - Surya Piplani, G. S. Visweswaran, Anshul Kumar:
Impact of crosstalk and process variation on capture power reduction for at-speed test. VTS 2016: 1-6
skipping 201 more matches
loading more results
failed to load more results, please try again later
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
retrieved on 2024-03-28 13:16 CET from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint