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Publication search results
found 40 matches
- 2023
- Jose Divasón, Julio Fernández-Ceniceros, Andrés Sanz-García, Alpha V. Pernía-Espinoza, Francisco Javier Martínez de Pisón:
PSO-PARSIMONY: A method for finding parsimonious and accurate machine learning models with particle swarm optimization. Application for predicting force-displacement curves in T-stub steel connections. Neurocomputing 548: 126414 (2023) - Jose Divasón, Alpha V. Pernía-Espinoza, Francisco J. Martínez de Pisón Ascacibar:
HYB-PARSIMONY: A hybrid approach combining Particle Swarm Optimization and Genetic Algorithms to find parsimonious models in high-dimensional datasets. Neurocomputing 560: 126840 (2023) - Hadi Shahabinejad, Davorin Sudac, Miltiadis Alamaniotis, Karlo Nad, Jasmina Objodas:
Bulk Sample Analysis Using Associated Alpha Particle Neutron Generator and Artificial Neural Network. IISA 2023: 1-4 - 2022
- Jose Divasón, Alpha V. Pernía-Espinoza, Francisco J. Martínez de Pisón Ascacibar:
New Hybrid Methodology Based on Particle Swarm Optimization with Genetic Algorithms to Improve the Search of Parsimonious Models in High-Dimensional Databases. HAIS 2022: 335-347 - Sayed Pouria Talebi, Stefan Werner, Yili Xia, Clive Cheong Took, Danilo P. Mandic:
A Joint Particle Filter for Quaternion-Valued $\alpha$-Stable Signals via the Characteristic Function. SAM 2022: 390-394 - 2021
- Shixin Cheng, Hao Zhan, Huiqin Yao, Huayu Fan, Yan Liu:
Large-scale many-objective particle swarm optimizer with fast convergence based on Alpha-stable mutation and Logistic function. Appl. Soft Comput. 99: 106947 (2021) - Julio Fernández-Ceniceros, Andrés Sanz-García, Alpha V. Pernía-Espinoza, Francisco Javier Martínez de Pisón:
PSO-PARSIMONY: A New Methodology for Searching for Accurate and Parsimonious Models with Particle Swarm Optimization. Application for Predicting the Force-Displacement Curve in T-stub Steel Connections. HAIS 2021: 15-26 - 2020
- Yunfeng Ge, Zishan Lin, Huiming Tang, Peng Zhong, Bei Cao:
Measurement of Particle Size of Loose Accumulation Based on Alpha Shapes (AS) and Hill Climbing-Region Growing (HC-RG) Algorithms. Sensors 20(3): 883 (2020) - 2019
- Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill:
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. IRPS 2019: 1-5 - 2018
- Anita J. Crompton, Kelum A. A. Gamage, Alex Jenkins, C. James Taylor:
Alpha Particle Detection Using Alpha-Induced Air Radioluminescence: A Review and Future Prospects for Preliminary Radiological Characterisation for Nuclear Facilities Decommissioning. Sensors 18(4): 1015 (2018) - 2017
- Matthias Sabel, Christian Sator, Tarek I. Zohdi, Ralf Müller:
Application of the Particle Finite Element Method in Machining Simulation Discussion of the Alpha-Shape Method in the Context of Strength of Materials. J. Comput. Inf. Sci. Eng. 17(1) (2017) - Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee:
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69: 100-108 (2017) - Jesse Tanguay, François Bénard, Anna Celler, Thomas Ruth, Paul Schaffer:
Spatial resolution properties of digital autoradiography systems for pre-clinical alpha particle imaging (Conference Presentation). Medical Imaging: Biomedical Applications in Molecular, Structural, and Functional Imaging 2017: 1013716 - 2016
- Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13(17): 20160627 (2016) - Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13(19): 20168001 (2016) - Nan Xia, Wen Wei, Jingchun Li, Xiaofei Zhang:
Kalman particle filtering algorithm for symmetric alpha-stable distribution signals with application to high frequency time difference of arrival geolocation. IET Signal Process. 10(6): 619-625 (2016) - Mansour Bagheri, Mahmoud Miri, Naser Shabakhty:
Fuzzy reliability analysis using a new alpha level set optimization approach based on particle swarm optimization. J. Intell. Fuzzy Syst. 30(1): 235-244 (2016) - 2015
- Hassan Maktuff Jaber Al-Ta'ii, Vengadesh Periasamy, Yusoff Mohd Amin:
Electronic Properties of DNA-Based Schottky Barrier Diodes in Response to Alpha Particles. Sensors 15(5): 11836-11853 (2015) - 2014
- Ezzat G. Bakhoum, Marvin H. M. Cheng, Kevin M. Van Landingham:
Alpha-Particle-Based Icing Detector for Aircraft. IEEE Trans. Instrum. Meas. 63(1): 185-191 (2014) - Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu:
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales. DATE 2014: 1-6 - 2012
- Mingzhe Liu, Xianguo Tuo, Jun Ren, Zhe Li, Lei Wang, Jianbo Yang:
A PSO-SVM Based Model for Alpha Particle Activity Prediction Inside Decommissioned Channels. ISNN (1) 2012: 517-523 - 2011
- Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta:
Alpha-particle-induced effects in partially depleted silicon on insulator device: With and without body contact. IET Circuits Devices Syst. 5(1): 52-58 (2011) - Jun Furuta, Chikara Hamanaka, Kazutoshi Kobayashi, Hidetoshi Onodera:
A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. ASP-DAC 2011: 83-84 - Nouha Jaoua, Emmanuel Duflos, Philippe Vanheeghe, Laurent Clavier, François Septier:
Impulsive interference mitigation in ad hoc networks based on alpha-stable modeling and particle filtering. ICASSP 2011: 3548-3551 - 2010
- Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo:
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. Microelectron. Reliab. 50(9-11): 1822-1831 (2010) - Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas:
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50(9-11): 1848-1851 (2010) - 2008
- Deniz Gençaga, Aysin Ertüzün, Ercan E. Kuruoglu:
Modeling of non-stationary autoregressive alpha-stable processes by particle filters. Digit. Signal Process. 18(3): 465-478 (2008) - Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt:
Single-event-upset and alpha-particle emission rate measurement techniques. IBM J. Res. Dev. 52(3): 265-274 (2008) - David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology. IBM J. Res. Dev. 52(3): 225-232 (2008) - G. E. Zardas, P. H. Yannakopoulos, Chrys I. Symeonides, Marián Veselý, P. C. Euthymiou:
A study of electron transition in the energy gap of SI-GaAs with photoconductivity spectra and under alpha-particle irradiation. Microelectron. J. 39(5): 737-739 (2008)
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