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Thomas Zimmer (Selection)

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12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. A. Koné, B. Grandchamp, C. Hainaut, François Marc, C. Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin: Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectronics Reliability 51(9-11): 1730-1735 (2011)
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Ghosh, B. Grandchamp, G. A. Koné, François Marc, C. Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin: Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectronics Reliability 51(9-11): 1736-1741 (2011)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. A. Koné, B. Grandchamp, C. Hainaut, François Marc, C. Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin: Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectronics Reliability 50(9-11): 1548-1553 (2010)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Ghosh, François Marc, C. Maneux, B. Grandchamp, G. A. Koné, Thomas Zimmer: Thermal aging model of InP/InGaAs/InP DHBT. Microelectronics Reliability 50(9-11): 1554-1558 (2010)

Selection of 4 from 14 records - Thomas Zimmer has 39 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page