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Wei Zhang (Selection)

University of Minnesota

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6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTae-Hyoung Kim, Wei Zhang, Chris H. Kim: An SRAM Reliability Test Macro for Fully Automated Statistical Measurements of ${\rm V} _{\rm MIN}$ Degradation. IEEE Trans. on Circuits and Systems 59-I(3): 584-593 (2012)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWei Zhang, Mingjing Ha, Daniele Braga, Michael J. Renn, C. Daniel Frisbie, Chris H. Kim: A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell Refresh Power. ISSCC 2011: 326-328
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKi Chul Chun, Wei Zhang, Pulkit Jain, Chris H. Kim: A 700MHz 2T1C embedded DRAM macro in a generic logic process with no boosted supplies. ISSCC 2011: 506-507
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn Keane, Wei Zhang, Chris H. Kim: An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization. J. Solid-State Circuits 46(10): 2374-2385 (2011)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWei Zhang, Ki Chul Chun, Chris H. Kim: Variation aware performance analysis of gain cell embedded DRAMs. ISLPED 2010: 19-24
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTae-Hyoung Kim, Wei Zhang, Chris H. Kim: An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation. CICC 2009: 231-234

Selection of 6 from 6 records - Wei Zhang has 9 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page