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University of Minnesota
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| 6 | Tae-Hyoung Kim, Wei Zhang, Chris H. Kim: An SRAM Reliability Test Macro for Fully Automated Statistical Measurements of ${\rm V} _{\rm MIN}$ Degradation. IEEE Trans. on Circuits and Systems 59-I(3): 584-593 (2012) | |
| 5 | Wei Zhang, Mingjing Ha, Daniele Braga, Michael J. Renn, C. Daniel Frisbie, Chris H. Kim: A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell Refresh Power. ISSCC 2011: 326-328 | |
| 4 | Ki Chul Chun, Wei Zhang, Pulkit Jain, Chris H. Kim: A 700MHz 2T1C embedded DRAM macro in a generic logic process with no boosted supplies. ISSCC 2011: 506-507 | |
| 3 | John Keane, Wei Zhang, Chris H. Kim: An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization. J. Solid-State Circuits 46(10): 2374-2385 (2011) | |
| 2 | Wei Zhang, Ki Chul Chun, Chris H. Kim: Variation aware performance analysis of gain cell embedded DRAMs. ISLPED 2010: 19-24 | |
| 1 | Tae-Hyoung Kim, Wei Zhang, Chris H. Kim: An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation. CICC 2009: 231-234 |
Selection of 6 from 6 records - Wei Zhang has 9 coauthors
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