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G. Q. Zhang (Selection)

G. Q. (Kouchi) Zhang

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5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. Yuan, W. D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, R. A. B. Engelen, Leo J. Ernst, F. van Keulen, G. Q. Zhang: Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions. Microelectronics Reliability 46(9-11): 1679-1684 (2006)

Selection of 1 from 32 records - G. Q. Zhang has 58 coauthors

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