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Thomas Zanon (Selection)

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5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLThomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865

Selection of 4 from 7 records - Thomas Zanon has 35 coauthors

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