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| 2 |       | Abdel-Fattah Yousif, Jun Gu: Concurrent automatic test pattern generation algorithm for combinational circuits. ICCD 1995: 286-291 |
| 1 |  | Abdel-Fattah Yousif, Jun Gu: An Efficient Global Search Algorithm for Test Generation. ISCAS 1993: 1499-1502 |
Selection of 2 from 2 records - Abdel-Fattah Yousif has 1 coauthors
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