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| 1 | Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja: On NBTI Degradation Process in Digital Logic Circuits. VLSI Design 2007: 723-730 |
Selection of 1 from 2 records - Xiangning Yang has 2 coauthors
Copyright © 2010-01-02 by Michael Ley (ley@uni-trier.de)