Takeshi Yanagisawa (Selection)

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5 Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi: Behavior of Cu(In, Ga)Se₂ solar cells under light/damp heat over time. Microelectronics Reliability 44(2): 229-235 (2004)

4 Takeshi Yanagisawa, Takeshi Kojima: The stability of the CuInSe₂ solar mini-module I-V characteristics under continuous and light/dark irradiation cycle tests. Microelectronics Reliability 43(3): 503-507 (2003)

3 Takeshi Yanagisawa, Takeshi Kojima: Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectronics Reliability 43(6): 977-980 (2003)

2 Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi, Kiyoshi Takahisa, Kuniomi Nakamura: Changes in the characteristics of CuInGaSe₂ solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method. Microelectronics Reliability 42(2): 219-223 (2002)

Selection of 4 from 6 records - Takeshi Yanagisawa has 23 coauthors

5		Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi: Behavior of Cu(In, Ga)Se₂ solar cells under light/damp heat over time. Microelectronics Reliability 44(2): 229-235 (2004)
4		Takeshi Yanagisawa, Takeshi Kojima: The stability of the CuInSe₂ solar mini-module I-V characteristics under continuous and light/dark irradiation cycle tests. Microelectronics Reliability 43(3): 503-507 (2003)
3		Takeshi Yanagisawa, Takeshi Kojima: Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectronics Reliability 43(6): 977-980 (2003)
2		Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi, Kiyoshi Takahisa, Kuniomi Nakamura: Changes in the characteristics of CuInGaSe₂ solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method. Microelectronics Reliability 42(2): 219-223 (2002)