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Akihiro Yamamoto (Selection)

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9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHideo Fujiwara, Akihiro Yamamoto: Parity-scan design to reduce the cost of test application. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1604-1611 (1993)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHideo Fujiwara, Akihiro Yamamoto: Parity-Scan Design to Reduce the Cost of Test Application. ITC 1992: 283-292

Selection of 2 from 67 records - Akihiro Yamamoto has 56 coauthors

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