Takahiro J. Yamaguchi (Selection)

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31 Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu: Design for Testability That Reduces Linearity Testing Time of SAR ADCs. IEICE Transactions 94-C(6): 1061-1064 (2011)

Selection of 1 from 35 records - Takahiro J. Yamaguchi has 50 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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