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| 3 | Yoshihiro Takao, Hiroshi Kudo, Junichi Mitani, Yoshiyuki Kotani, Satoshi Yamaguchi, Keizaburo Yoshie, Kazuo Sukegawa, Nobuhisa Naori, Satoru Asai, Michiari Kawano: A 0.11 mum CMOS technology featuring copper and very low k interconnects with high performance and reliability. Microelectronics Reliability 42(1): 15-25 (2002) |
Selection of 1 from 18 records - Satoshi Yamaguchi has 82 coauthors
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