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| 1 | Jian Chen, Jianbin Xu, K. Xue, J. An, Ning Ke, W. Cao, H. B. Xia, J. Shi, D. C. Tian: Nanoscale structural characteristics and electron field emission properties of transition metal-fullerene compound TiC60 films. Microelectronics Reliability 45(1): 137-142 (2005) |
Selection of 1 from 1 records - Jianbin Xu has 8 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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