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C. J. Wilson (Selection)

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2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Lofrano, K. Croes, Ingrid De Wolf, C. J. Wilson: Influence of test structure design on stress-induced-voiding using an experimentally validated Finite Element Modeling approach. Microelectronics Reliability 51(9-11): 1578-1581 (2011)

Selection of 1 from 2 records - C. J. Wilson has 6 coauthors

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