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P. J. van der Wel (Selection)

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4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Dammann, W. Pletschen, Patrick Waltereit, W. Bronner, Rüdiger Quay, S. Müller, Michael Mikulla, Oliver Ambacher, P. J. van der Wel, S. Murad, T. Rödle, R. Behtash, F. Bourgeois, K. Riepe, M. Fagerlind, E. Ö. Sveinbjörnsson: Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. Microelectronics Reliability 49(5): 474-477 (2009)

Selection of 1 from 4 records - P. J. van der Wel has 30 coauthors

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