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P. J. van der Wel (Selection)

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2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLP. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher: Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Microelectronics Reliability 46(8): 1279-1284 (2006)

Selection of 1 from 4 records - P. J. van der Wel has 30 coauthors

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