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J. Wang (Selection)

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11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. M. De Souza, J. Wang, S. K. Manhas, E. M. Sankara Narayanan, A. S. Oates: A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors. Microelectronics Reliability 41(2): 169-177 (2001)

Selection of 1 from 61 records - J. Wang has 195 coauthors

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