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| 1 | John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly: Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. ITC 2001: 258-267 |
Selection of 1 from 1 records - Ken Walker has 5 coauthors
Copyright © 2009-12-24 by Michael Ley (ley@uni-trier.de)