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| 8 |       | Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik: Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022 |
| 7 | | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 |
| 6 | | Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee: A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191 |
| 5 | | Ramakrishna Voorakaranam, Abhijit Chatterjee: Test Generation for Accurate Prediction of Analog Specifications. VTS 2000: 137-142 |
| 4 | | Ramakrishna Voorakaranam, Abhijit Chatterjee: Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. ARVLSI 1999: 342-357 |
| 3 | | Ramakrishna Voorakaranam, Abhijit Chatterjee: Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. VTS 1999: 296-303 |
| 2 | | Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee: Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. DFT 1998: 341-348 |
| 1 | | Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao: Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912 |
Selection of 8 from 8 records - Ramakrishna Voorakaranam has 12 coauthors
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