Heinrich Theodor Vierhaus (Selection)

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15 Uwe Hübner, Heinrich Theodor Vierhaus, Raul Camposano: Partitioning and analysis of static digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1292-1310 (1997)

4 Uwe Hübner, Heinrich Theodor Vierhaus: Efficient partitioning and analysis of digital CMOS-circuits. ICCAD 1992: 280-283

2 Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29

1 Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus: CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents. Microprocessing and Microprogramming 35(1-5): 377-382 (1992)

Selection of 4 from 65 records - Heinrich Theodor Vierhaus has 69 coauthors

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15		Uwe Hübner, Heinrich Theodor Vierhaus, Raul Camposano: Partitioning and analysis of static digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1292-1310 (1997)
4		Uwe Hübner, Heinrich Theodor Vierhaus: Efficient partitioning and analysis of digital CMOS-circuits. ICCAD 1992: 280-283
2		Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29
1		Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus: CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents. Microprocessing and Microprogramming 35(1-5): 377-382 (1992)