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Massimo Vanzi (Selection)

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26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMatteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: Chip and package-related degradation of high power white LEDs. Microelectronics Reliability 52(5): 804-812 (2012)
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMatteo Meneghini, L. Trevisanello, C. Sanna, G. Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectronics Reliability 47(9-11): 1625-1629 (2007)
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMatteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006)

Selection of 3 from 26 records - Massimo Vanzi has 55 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page