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Stanislav Tyaginov (Selection)

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3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser: An analytical approach for physical modeling of hot-carrier induced degradation. Microelectronics Reliability 51(9-11): 1525-1529 (2011)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser: Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability 50(9-11): 1267-1272 (2010)

Selection of 2 from 3 records - Stanislav Tyaginov has 16 coauthors

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