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| 1 |       | Satoshi Tsuji, Katsuhiro Tsujimoto, Hideo Iwama: Application of cross-sectional transmission electron microscopy to thin-film-transistor failure analysis. IBM Journal of Research and Development 42(3): 509-516 (1998) |
Selection of 1 from 3 records - Satoshi Tsuji has 5 coauthors
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