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| 6 | Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino: Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors. IEICE Transactions 89-A(10): 2535-2542 (2006) |
Selection of 1 from 7 records - Xuan Nam Tran has 7 coauthors
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