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P. Tounsi (Selection)

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6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLE. Marcault, M. Breil, A. Bourennane, P. Tounsi, J. M. Dorkel: Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectronics Reliability 52(3): 489-496 (2012)

Selection of 1 from 6 records - P. Tounsi has 24 coauthors

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