André Touboul (Selection)

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10 A. Sozza, A. Curutchet, Christian Dua, N. Malbert, Nathalie Labat, André Touboul: AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectronics Reliability 46(9-11): 1725-1730 (2006)

Selection of 1 from 16 records - André Touboul has 69 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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