Sandip Tiwari (Selection)

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3 Arvind Kumar, Sandip Tiwari: Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. DFT 2004: 280-288

2 Arvind Kumar, Sandip Tiwari: A power-performance adaptive low voltage analog circuit design using independently controlled double gate CMOS technology. ISCAS (1) 2004: 197-200

1 Arvind Kumar, Sandip Tiwari: Defect tolerance for nanocomputer architecture. SLIP 2004: 89-96

Selection of 3 from 7 records - Sandip Tiwari has 7 coauthors

3		Arvind Kumar, Sandip Tiwari: Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. DFT 2004: 280-288
2		Arvind Kumar, Sandip Tiwari: A power-performance adaptive low voltage analog circuit design using independently controlled double gate CMOS technology. ISCAS (1) 2004: 197-200
1		Arvind Kumar, Sandip Tiwari: Defect tolerance for nanocomputer architecture. SLIP 2004: 89-96