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| 3 | Joachim Bayer, Sebastien Gerard, Øystein Haugen, Jason Xabier Mansell, Birger Møller-Pedersen, Jon Oldevik, Patrick Tessier, Jean-Philippe Thibault, Tanya Widen: Consolidated Product Line Variability Modeling. Software Product Lines 2006: 195-241 |
Selection of 1 from 4 records - Patrick Tessier has 12 coauthors
Copyright © 2009-12-24 by Michael Ley (ley@uni-trier.de)