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Masatomo Takeichi (Selection)

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEvan G. Colgan, Robert J. Polastre, Masatomo Takeichi, Robert L. Wisnieff: Thin-film-transistor process-characterization test structures. IBM Journal of Research and Development 42(3): 481-490 (1998)

Selection of 1 from 2 records - Masatomo Takeichi has 5 coauthors

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