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| 1 |       | Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama: Interconnect and Delay Testing with a 4800-Pin Board Tester. ITC 1992: 338-344 |
Selection of 1 from 1 records - Naoki Takayama has 3 coauthors
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