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K. Takakura (Selection)

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2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLK. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectronics Reliability 46(9-11): 1731-1735 (2006)
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLK. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005)

Selection of 2 from 2 records - K. Takakura has 9 coauthors

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