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| 1 | Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000) |
Selection of 1 from 1 records - S. Török has 4 coauthors
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