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| 153 | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Investigation of diffusion rounding for post-lithography analysis. ASP-DAC 2008: 480-485 | |
| 128 | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Line-End Shortening is Not Always a Failure. DAC 2007: 270-271 | |
| 112 | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester: Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation. IEEE Trans. on CAD of Integrated Circuits and Systems 26(9): 1614-1624 (2007) | |
| 91 | Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Dennis Sylvester: Gate-length biasing for runtime-leakage control. IEEE Trans. on CAD of Integrated Circuits and Systems 25(8): 1475-1485 (2006) | |
| 81 | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester: Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions. DAC 2005: 365-368 | |
| 70 | Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang: Performance Driven OPC for Mask Cost Reduction. ISQED 2005: 270-275 | |
| 57 | Luigi Capodieci, Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang: Toward a methodology for manufacturability-driven design rule exploration. DAC 2004: 311-316 | |
| 56 | Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Dennis Sylvester: Selective gate-length biasing for cost-effective runtime leakage control. DAC 2004: 327-330 | |
| 39 | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester: Investigation of performance metrics for interconnect stack architectures. SLIP 2004: 23-29 | |
| 28 | Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang: A cost-driven lithographic correction methodology based on off-the-shelf sizing tools. DAC 2003: 16-21 |
Selection of 10 from 223 records - Dennis Sylvester has 170 coauthors
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