Iboun Taimiya Sylla (Selection)

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4

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006)

Selection of 1 from 4 records - Iboun Taimiya Sylla has 6 coauthors