Shigeru Sugamori (Selection)

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2 Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata: High-Fidelity Device Tester Interface. ITC 1983: 371-378

1 Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo: Analysis and Definition of Overall Timing Accuracy in VLSI Test System. ITC 1981: 143-153

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2		Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata: High-Fidelity Device Tester Interface. ITC 1983: 371-378
1		Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo: Analysis and Definition of Overall Timing Accuracy in VLSI Test System. ITC 1981: 143-153