Ching Y. Suen (Selection)

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196 Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Binary Decision Tree Using Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. Canadian Conference on AI 2004: 461-466

192 Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. IEA/AIE 2004: 341-350

191 In-Cheol Kim, Kyoung Min Kim, Ching Y. Suen: Word Separation in Handwritten Legal Amounts on Bank Cheques Based on Spatial Gap Distances. IEA/AIE 2004: 453-462

184 Kyoung Min Kim, Joong Jo Park, Young Gi Song, In-Cheol Kim, Ching Y. Suen: Recognition of Handwritten Numerals Using a Combined Classifier with Hybrid Features. SSPR/SPR 2004: 992-1000

181 Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Detection of ridges and ravines using fuzzy logic operations. Pattern Recognition Letters 25(6): 743-751 (2004)

Selection of 5 from 281 records - Ching Y. Suen has 205 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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196		Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Binary Decision Tree Using Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. Canadian Conference on AI 2004: 461-466
192		Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. IEA/AIE 2004: 341-350
191		In-Cheol Kim, Kyoung Min Kim, Ching Y. Suen: Word Separation in Handwritten Legal Amounts on Bank Cheques Based on Spatial Gap Distances. IEA/AIE 2004: 453-462
184		Kyoung Min Kim, Joong Jo Park, Young Gi Song, In-Cheol Kim, Ching Y. Suen: Recognition of Handwritten Numerals Using a Combined Classifier with Hybrid Features. SSPR/SPR 2004: 992-1000
181		Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen: Detection of ridges and ravines using fuzzy logic operations. Pattern Recognition Letters 25(6): 743-751 (2004)