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| 3 | Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460 | |
| 2 | Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241 |
Selection of 2 from 3 records - Rudi Stans has 8 coauthors
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