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| 14 | Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song: Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability 45(9-11): 1471-1475 (2005) |
Selection of 1 from 25 records - Peilin Song has 191 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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