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| 4 | Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif: Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40 |
Selection of 1 from 4 records - Jayakumaran Sivagnaname has 12 coauthors
Copyright © 2009-12-27 by Michael Ley (ley@uni-trier.de)