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A. F. Shulekin (Selection)

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4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. I. Vexler, A. El Hdiy, D. Grgec, S. E. Tyaginov, R. Khlil, Bernd Meinerzhagen, A. F. Shulekin, I. V. Grekhov: Tunnel charge transport within silicon in reversely-biased MOS tunnel structures. Microelectronics Journal 37(2): 114-120 (2006)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. E. Tyaginov, M. I. Vexler, A. F. Shulekin, I. V. Grekhov: The post-damage behavior of a MOS tunnel emitter transistor. Microelectronics Reliability 46(7): 1035-1041 (2006)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Khlil, A. El Hdiy, A. F. Shulekin, S. E. Tyaginov, M. I. Vexler: Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness. Microelectronics Reliability 44(3): 543-546 (2004)
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLN. Asli, M. I. Vexler, A. F. Shulekin, P. D. Yoder, I. V. Grekhov, P. Seegebrecht: Threshold energies in the light emission characteristics of silicon MOS tunnel diodes. Microelectronics Reliability 41(7): 1071-1076 (2001)

Selection of 4 from 4 records - A. F. Shulekin has 10 coauthors

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