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| 5 | Jeonghee Shin, Victor V. Zyuban, Pradip Bose, Timothy Mark Pinkston: A Proactive Wearout Recovery Approach for Exploiting Microarchitectural Redundancy to Extend Cache SRAM Lifetime. ISCA 2008: 353-362 | |
| 4 | Jeonghee Shin, Victor V. Zyuban, Zhigang Hu, Jude A. Rivers, Pradip Bose: A Framework for Architecture-Level Lifetime Reliability Modeling. DSN 2007: 534-543 |
Selection of 2 from 5 records - Jeonghee Shin has 7 coauthors
Copyright © 2009-12-28 by Michael Ley (ley@uni-trier.de)