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| 4 | Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar: Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. European Test Symposium 2011: 211 |
Selection of 1 from 4 records - Y. Shi has 16 coauthors
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