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Wen-Zen Shen (Selection)

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12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJwu E. Chen, Chung-Len Lee, Wen-Zen Shen, Beyin Chen: Fanout fault analysis for digital logic circuits. Asian Test Symposium 1995: 33-39
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChung-Len Lee, Ching Ping Wu, Wen-Zen Shen, Tyh-Song Hwang, Shueng Dar Hwang: MT-SIM a mixed-level transition fault simulator based on parallel patterns. J. Electronic Testing 3(1): 67-78 (1992)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJwu E. Chen, Chung-Len Lee, Wen-Zen Shen: Single-fault fault-collapsing analysis in sequential logic circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(12): 1559-1568 (1991)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJwu E. Chen, Chung-Len Lee, Wen-Zen Shen: Checkpoints in irredundant two-level combinational circuits. J. Electronic Testing 2(4): 395-397 (1991)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTyh-Song Hwang, Chung-Len Lee, Wen-Zen Shen, Ching Ping Wu: A Parallel Pattern Mixed-Level Fault Simulator. DAC 1990: 716-719
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJwu E. Chen, Chung-Len Lee, Wen-Zen Shen: Single-fault fault collapsing analysis in sequential logic circuits. ITC 1990: 809-814

Selection of 6 from 22 records - Wen-Zen Shen has 22 coauthors

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