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| 2 | Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong: Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. ASP-DAC 2009: 161-166 |
Selection of 1 from 3 records - Ruijing Shen has 8 coauthors
Copyright © 2009-12-27 by Michael Ley (ley@uni-trier.de)