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Sharad C. Seth (Selection)

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67Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya: Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects. Asian Test Symposium 2011: 297-302
61Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya: A Unified Solution to Scan Test Volume, Time, and Power Minimization. VLSI Design 2010: 9-14
60Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhen Chen, Sharad C. Seth, Dong Xiang: A novel hybrid delay testing scheme with low test power, volume, and time. VTS 2010: 307-312
59Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya: PVT: Unified Reduction of Test Power, Volume, and Test Time Using Double-Tree Scan Architecture. J. Low Power Electronics 6(3): 457-468 (2010)

Selection of 4 from 68 records - Sharad C. Seth has 56 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page