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J. Schwarz (Selection)

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5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner: Test and reliability challenges in automotive microelectronics. DATE 2006: 547

Selection of 1 from 5 records - J. Schwarz has 10 coauthors

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