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Yvon Savaria (Selection)

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59Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBing Qiu, Yvon Savaria, Meng Lu, Chunyan Wang, Claude Thibeault: Yield Modeling of a WSI Telecom Router Architecture. DFT 2002: 314-324
45Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGinette Monté, Bernard Antaki, Serge Patenaude, Yvon Savaria, Claude Thibeault, Pieter M. Trouborst: Tools for the Characterization of Bipolar CML Testability. VTS 2001: 388-395
31Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichel Kafrouni, Claude Thibeault, Yvon Savaria: A Cost Model for VLSI / MCM Systems. DFT 1997: 148-156
30Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYves Gagnon, Yvon Savaria, Michel Meunier, Claude Thibeault: Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model. DFT 1997: 157-165
27no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, André Ivanov: Panel Summaries. IEEE Design & Test of Computers 13(3): 6, 110-112 (1996)
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLClaude Thibeault, Yvon Savaria, Jean-Louis Houle: Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits. IEEE Trans. Computers 44(5): 724-728 (1995)
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLClaude Thibeault, Yvon Savaria, Jean-Louis Houle: A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits. IEEE Trans. Computers 43(6): 687-698 (1994)
9no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Crépeau, Claude Thibeault, Yvon Savaria: Some Results on Yield and Local Design Rule Relaxation. DFT 1993: 144-151
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLClaude Thibeault, Yvon Savaria, Jean-Louis Houle: Test quality of hierarchical defect-tolerant integrated circuits. J. Electronic Testing 3(1): 93-102 (1992)

Selection of 9 from 164 records - Yvon Savaria has 186 coauthors

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