Sebastian Sattler (Selection)

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5 Reik Muller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes: An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. DATE 2009: 1662-1667

4 A. Tchegho, Heinz Mattes, Sebastian Sattler: Optimal High-Resolution Spectral Analyzer. DATE 2008: 62-67

2 Heinz Mattes, Stéphane Kirmser, Sebastian Sattler: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. J. Electronic Testing 22(4-6): 337-350 (2006)

1 Heinz Mattes, Claus Dworski, Sebastian Sattler: Controlled Sine Wave Fitting for ADC Test. ITC 2004: 963-971

Selection of 4 from 5 records - Sebastian Sattler has 11 coauthors

5		Reik Muller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes: An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. DATE 2009: 1662-1667
4		A. Tchegho, Heinz Mattes, Sebastian Sattler: Optimal High-Resolution Spectral Analyzer. DATE 2008: 62-67
2		Heinz Mattes, Stéphane Kirmser, Sebastian Sattler: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. J. Electronic Testing 22(4-6): 337-350 (2006)
1		Heinz Mattes, Claus Dworski, Sebastian Sattler: Controlled Sine Wave Fitting for ADC Test. ITC 2004: 963-971